2015年辐射效用和辐射防护学术研讨会(RERP 2015)

发布时间:2015-04-21 13:34:19

The 2nd International Conference on Radiation Effects and Radiation Protection (RERP 2015) will be held from August 25 to 27, 2015 in Shanghai, China. This Conference will cover issues on Radiation Effects and Radiation Protection. 

Publication and Presentation

All the accepted papers will be published by "Journal of Applied Mathematics and Physics" (ISSN: 2327-4352), a peer-reviewed open access journal that can ensure the widest dissemination of your published work. For more information, please visit: http://www.scirp.org/journal/jamp/

The conference is soliciting state-of-the-art research papers in the following areas of interest: 

   Atomistic and Collective Processes of Radiation Effects

     Fundamental Knowledge on Atomistic and Electronic Defect Production and Stability

     Irradiation-induced Microstructural Evolution and Material Modifications

     Fundamentals, Theory and Computer Simulations

     Advances in Defect and Material Characterization

     Radiation Response of Nanomaterials

     Swift Heavy Ion Irradiations

     Neutron Irradiations

     Laser-solid Interactions

     Electron-solid Interactions 

  Irradiated Materials

     Simple and Complex Oxides

     Carbides and Nitrides

     Polymers

     Ionic Crystals

     Semiconductor and Scintillator Materials

     Glasses and Silica

     Carbon-based Materials

     Nanocomposites and Nanostructured Materials 

  Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

     Single-Event Charge Collection Phenomena and Mechanisms

     Radiation Transport, Energy Deposition and Dosimetry

     Ionizing Radiation Effects

     Materials and Device Effects

     Displacement Damage

     Processing-Induced Radiation Effects 

  Radiation Effects on Electronic and Photonic Devices and Circuits

     Single-Event Effects

     MOS, Bipolar and Advanced Technologies

     Isolation Technologies, such as SOI and SOS

     Optoelectronic and Optical Devices and Systems

     Methods for Hardened Design and Manufacturing

     Modeling of Devices, Circuits and Systems

     Particle Detectors and Associated Electronics for High-Energy Accelerators and Nuclear Power Facilities

     Cryogenic or High Temperature Effects

     Novel Device Structures, such as MEMs and Nanotechnologies 

  Radiation Safety and Detection

     Radiation Transport and Shielding

     Radiation Dosimetry

     Radiation Detection and Sensor Technology

     Environmental Radiation Measurement and Assessment

     Radiological Risk Management

     Radiation Protection Philosophy

     Policy and Current Radiological issues

     Education and Training in Radiation Safety

会议时间2015-08-25至2015-08-27
会议地点上海虹口区
主办单位工程信息研究院
联系人Vivian
电话+86 156 2908 5792
Emailphy_aug@engii.org
官方网址http://www.engii.org/ws/Home.aspx?id=575

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