第二届雷达与成像技术国际会议(ICRIT 2019)

第二届雷达与成像技术国际会议(ICRIT 2019)
The 2nd Int'l Conference on Radar and Imaging Technology (ICRIT 2019)

大会时间: 2019年7月19-21日
大会地点: 桂林
大会官网: http://www.confjuly.org/conference/ICRIT2019/
在线注册: http://www.confjuly.org/RegistrationSubmission/default.aspx?ConferenceID=1125
邮箱：intelconf@163.com

演讲嘉宾
Prof. GuiYun Tian, Newcastle University, UK
Prof. Yizhou Yu, University of Hong Kong, China
Dr. Ahmed Abdelgawad, Central Michigan University, USA
Prof. Gongjian Zhou, Harbin Institute of Technology, China
Dr. Junichi Takiguchi, Mitsubishi Electric Corporation, Japan
Prof. Longfei Shi, National University of Defense Technology, China
Dr. Jibin Zheng, National Laboratory of Radar Signal Processing, Xidian University, China

文章出版

出版物：Computer and Communications 领域开源期刊
检索类型：知网及谷歌学术收录
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联系方式

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大会议题

会议征稿范围包含但不限于以下领域：

Radar Phenomenology
Radar Systems
Advanced Subsystems/Components
Radar Design and Simulation
SAR/ISAR/Ultra-wideband Radar
Passive/Noise/Cognitive/MIMO Radars
Waveform Diversity
Signal and Data Processing
Computer Modeling
Environment Sensing and Modeling
Advanced RF and Antenna Technologies
Space Technology and Remote Sensing
Synthetic Aperture Techniques
Radar Imaging Technology
Emerging Technologies
Threats and Countermeasures
Radar Applications

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